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Industrial Microscopes

Wiloskop ST-PF

Wiloskop ST-PF

Stereo microscope for the examination of opaque materials and dimensional microscopic measurements in incident light
The Wiloskop ST-PF is equipped with an incident-light LED ring illuminator that can be segmented to highlight surface structures. The total optical magnification can continuously be set between 6.7x and 45x and may be increased to 180x with optional auxiliary lenses and eyepieces. The pixel-fox system stores microscopic images and carries out dimensional measurements.
  • Contrasting technique: brightfield (incident light)
  • Eyepieces: WF10x/22
  • Optical system: trinocular, with C-Mount adapter 0.5x
  • Objective magnification: 0,67x-4,5x
  • Incident light: LED ring light
  • Microscope stand: with focusing arm and black-white insertion plate
  • Measuring system: pixel-fox (dhs Solution GmbH)

Details

H 600 AM AL/DL 50

H 600 AM AL/DL 50

For the examination of opaque materials in incident light and of transparent objects in transmitted light
The H 600 AM AL/DL 50 is equipped with a transmitted-light illumination and with an incident-light illuminator. Special objectives allow the user to carry out incident-light examinations of various materials, a lowerable microscope stage the examination of objects with heights of up to 50 mm. The solid cast-metal stand guarantees ergonomic operation, high stability and durability.
  • Contrasting technique: brightfield (incident/transmitted light)
  • Eyepieces: WF10x/20
  • Observation tube: binocular
  • Objectives: EPI 4:1, EPI 10:1, EPI 20:1, EPI 40:1
  • Condenser: NA0,9 (transmitted light)
  • Illumination: halogen lamp, 30 W (transmitted light)
  • Incident light: Illuminator with 150 W fibre light source
  • Microscope stage: lowerable

Details

H 600 AM PF

H 600 AM PF

For the examination of opaque materials in incident light and of transparent objects in transmitted light
The H 600 AM PF is equipped with an incident-light illuminator. Special objectives allow the user to carry out incident-light examinations of various materials, a lowerable microscope stage the examination of objects with heights of up to 50 mm. The solid cast-metal stand guarantees ergonomic operation, high stability and durability. The pixel-fox system stores microscopic images and carries out dimensional measurements.
  • Contrasting technique: brightfield, (incident light)
  • Eyepieces: WF10x/18
  • Observation tube: trinocular, with C-Mount adapter 0.5x
  • Objectives: EPI 4:1, EPI 10:1, EPI 20:1, EPI 40:1
  • Incident light: Illuminator with 150 W fibre light source
  • Microscope stage: lowerable
  • Measuring system: pixel-fox (dhs Solution GmbH)

Details