Industrial Microscopes
Wiloskop ST-PF
Stereo microscope for the examination of opaque materials and dimensional microscopic measurements in incident light
- Contrasting technique: brightfield (incident light)
- Eyepieces: WF10x/22
- Optical system: trinocular, with C-Mount adapter 0.5x
- Objective magnification: 0,67x-4,5x
- Incident light: LED ring light
- Microscope stand: with focusing arm and black-white insertion plate
- Measuring system: pixel-fox (dhs Solution GmbH)
H 600 AM AL/DL 50
For the examination of opaque materials in incident light and of transparent objects in transmitted light
- Contrasting technique: brightfield (incident/transmitted light)
- Eyepieces: WF10x/20
- Observation tube: binocular
- Objectives: EPI 4:1, EPI 10:1, EPI 20:1, EPI 40:1
- Condenser: NA0,9 (transmitted light)
- Illumination: halogen lamp, 30 W (transmitted light)
- Incident light: Illuminator with 150 W fibre light source
- Microscope stage: lowerable
H 600 AM PF
For the examination of opaque materials in incident light and of transparent objects in transmitted light
- Contrasting technique: brightfield, (incident light)
- Eyepieces: WF10x/18
- Observation tube: trinocular, with C-Mount adapter 0.5x
- Objectives: EPI 4:1, EPI 10:1, EPI 20:1, EPI 40:1
- Incident light: Illuminator with 150 W fibre light source
- Microscope stage: lowerable
- Measuring system: pixel-fox (dhs Solution GmbH)